Advanced characterization of nanostructures and interfaces

Transmission electron microscopy allows precise structural characterisation and imaging of materials at a nanoscale. Nevertheless, an important issue is the chemical analysis of materials with high spatial resolution. This talk will focus on electron energy loss spectrometry (EELS) which is a well-known technique for chemical analysis, especially of light elements.

At USTEM we apply EELS regularly in order to investigate magnetic properties of nanostructures by means of Electron Energy Loss Magnetic Chiral Dichroism (EMCD), for the investigation of optical properties with low loss and low voltage EELS but also to study binding and valence states. Examples of these applications and recent progress with EELS will be presented and delocalisation effects that influence the spatial resolution will be discussed.
 

Institution: 

Technische Universität Wien, University Service Centre for Transmission Electron
Microscopy, Vienna, Austria

Date: 
Wednesday, June 28, 2017 - 14:00
Speaker: 
Prof. Johannes Bernardi