Erich Schmid Colloquium

Datum Institution Speaker Title
Thursday, July 11, 2013 - 14:00

Department of Mechanical Engineering, University of Southern Florida, USA

Volinsky Alex Advanced Nanomechanical Testing Techniques
Thursday, June 27, 2013 - 10:00

Mechanical and Industrial Engineering Department, University, Rome, ITALY
 

M. Sebastiani Innovative methodologies for residual stress analysis at the micron-scale via FIB relaxation
Friday, April 19, 2013 - 11:45

Solid state Physics, Siegen University

Pietsch Ullrich Materials analysis by use of modern X-ray diffraction techniques
Tuesday, February 5, 2013 - 13:15

School of Materials Science & Engineering, Nanyang Technological University, Singapore

Dong Z.L. Crystal structure characterisation of titanate based photocatalytic nanomaterials for the degradation of organic compounds
Tuesday, January 8, 2013 - 13:15

Department of Physics, Durham University

Taylor Aidan A. Cathodoluminescence as a tool to understand the electrical properties of planar defects in thin film photovoltaic materials

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